Séminaire de Christopher Peddie
Le 20 mai 2016
Un séminaire sera donné par Christopher Peddie, Electron Microscopy Science Technology Platform, The Francis Crick Institute, London.
«Serial blockface imaging and correlative microscopy: exploring the third dimension»
Les étudiants de médecine/pharmacie devant valider certains modules (M1 et M2) devront impérativement venir avec leur fiche personnelle de validation des séminaires qui sera alors tamponnée.
12h00 - 13h00
ICO site Paul Papin, amphithéâtre
secr-inserm-angers @ contact.univ-angers.fr
The ultrastructural examination of cellular systems is experiencing a dramatic resurgence in interest, driven both by advances in instrumentation, and the continued development of specimen preparation techniques. As a result, we are rapidly entering an era of increasingly automated 3-dimensional visualisation, where large-scale data can be rendered with unparalleled levels of detail. The serial blockface scanning electron microscope (SBF SEM) is one such instrument, comprising a miniaturised ultramicrotome designed to fit inside an SEM chamber. It has the capacity to automatically acquire thousands of high resolution images by using a diamond knife to section through resin embed specimens whilst sequentially imaging each freshly exposed surface with the electron beam.
Simultaneously, a revolution in correlative microscopy techniques is underway. Correlative light and electron microscopy (CLEM) combines the benefits of fluorescence and electron imaging modalities by revealing detailed protein localisation in the context of underlying cellular structure, and much of our recent work at The Francis Crick Institute has focused on the development of correlative light and volume EM workflows. These techniques have the potential to substantially increase the speed and precision of CLEM, whilst widening accessibility beyond the realm of expert electron microscopists.
Here, I will discuss some recent projects and strategies for SBF SEM based imaging. As correlative light and volume electron microscopes become increasingly integrated, and all-in-one solutions are developed, I will also describe how we are using SBF SEM and other volume EM techniques to directly correlate functional information with ultrastructural detail within a 3-dimensional reference space.